Runs and Scans with Applications
-
Hardback
- ISBN
- 9780471248927
- Publish Date
- Nov 2001
- List Price
- $263.95
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eBook
- ISBN
- 9781118150450
- Publish Date
- Sep 2011
- List Price
- $263.95
Classroom Resources
Where to buy it
Description
Dieser Band führt anhand vieler Beispiele aus Naturwissenschaft und Technik in spezielle Kapitel der Zuverlässigkeitsanalyse ein. Theoretische Ausführungen werden anschaulich mit praktischen Anwendungen, meist aus der Industrie, verknüpft, um den Leser zur tiefgründigen Einarbeitung in die Konzepte zu motivieren. Erläutert werden auch relevante Näherungen und Randwertsätze.
About the authors
Contributor Notes
N. BALAKRISHNAN, PhD, is Professor of Mathematics and Statistics at McMaster University in Hamilton, Ontario, Canada. He is also the author of A First Course in Order Statistics and four volumes of the Distributions in Statistics series (all from Wiley).
MARKOS V. KOUTRAS, PhD, is Professor of Statistics at the University of Piraeus in Greece, where he researches applied probability, reliability, and distribution theory.
Editorial Reviews
“…many excellent features…” (Statistical Methods in Medical Research, No.13, 2004)
"...provides excellent coverage of the topic of scans, and runs, including a nice historical account and guide to the literature..." (Technometrics, Vol. 44, No. 4, November 2002)
"...highly recommended…well done and perfectly edited..." (Journal of the American Statistical Association, December 2002)
"...a great resource..." (International Journal of General Systems, Vol. 32, 2003)