With the proliferation of complex semiconductor devices containing digital, analog, mixed-signal and radio-frequency circuits, the economics of test has come to the forefront and today's engineer needs to be fluent in all four circuit types. Having access to a book that covers these topics will help the evolving test engineer immensely and will be an invaluable resource. In addition, the second edition includes lengthy discussion on RF circuits, high-speed I/Os and probabilistic reasoning. Appropriate for the junior/senior university level, this textbook includes hundreds of examples, exercises and problems.

Gordon Roberts' profile page

Friedrich Taenzler's profile page

Mark Burns' profile page

Gordon Roberts is a professor in the Department of Electrical and Computer Engineering at McGill University. He has conducted extensive research on analog integrated circuit design and mixed-signal test issues. He has published numerous papers at IEEE conferences, coauthored several textbooks related to mixed-signal test and analog integrated circuit design (including SPICE, 2e with Adel Sedra, OUP, 1996), and contributed various specialized volumes to other books. Friedrich Taenzler is currently an RF-Engineering Manager at Texas Instruments and is a major contributor in the field of RF testing and design. Mark Burns is a former TI fellow at Texas Instruments and an accomplished expert in mixed-signal IC test and measurement area.